Chip wafer inspection machine
(IC inspection & Taping machine)
Objects products: | Wafer 5 Inch ~8 Inch |
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Chip size 0.4mm ~4mm | |
Processing speed: | 45 minutes/Wafer 6 Inch ±10% |
Jam rate: | 0/3000 pcs |
Inspection surface: | Face of wafer |
Inspection content: | Chip crack, miss dicing, dirty |
Capacity inspection: | 8μm×8μm |
Operation route:
Put wafer to inspection stage. Camera is moved by XY axis to captute image of one by one of chip for inspecting
If inspection result is NG, information of mapfile is changed for this chip
If inspection result is NG, information of mapfile is changed for this chip
Some images NG samples which machine detected
Crack, dicing miss
Dirty, rubbish